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Multilayer Ceramic Chip Capacitors
Test Conditions and Standards
Test Conditions and Specifications for Temperature Compensation Type (C Δ to U Δ ? SL Characteristics)
CM/ CT/ CF Series
Test Items
Test Conditions
Specifications
Capacitance Value (C)
Q
Capacitance Frequency
C ≤ 1000pF 1MHz ± 10%
C > 1000pF 1kHz ± 10%
Volt
0.5 to 5Vrms
Within tolerance
C ≥ 30pF : Q ≥ 1000
C<30pF : Q ≥ 400 + 20C
Measured after the rated voltage is applied for 1
minute at room ambient.
Insulation Resistance (IR)
Dielectric Resistance
Appearance
Termination Strength
Bending Strength
For the rated voltage of over 630V, apply 500V
for 1 minute at room ambient.
The charge and discharge current of the capacitor
must not exceed 50mA.
Apply 3 times of the rated voltage for 1 to 5 seconds.
Apply 1.5 times when the rated voltage is 250V or over.
Apply 1.2 times when the rated voltage is 630V or over.
The charge and discharge current of the capacitor
must not exceed 50mA.
Microscope
Apply a sideward force of 500g (5N) to a PCB-
mounted sample. Apply 2N for 0201, and 1N for
01005 size.
Glass epoxy PCB: Fulcrum spacing: 90mm, duration
time 10 seconds.
Over 10000M Ω or 500M Ω ? μ F, whichever is less
No problem observed
No problem observed
No problem observed
No significant damage at 1mm bent
Vibration
Test
Soldering
Heat
Resistance
Appearance
Δ C
Q
Appearance
Δ C
Q
Vibration frequency: 10 to 55 (Hz)
Amplitude: 1.5mm
Sweeping condition: 10 → 55 → 10Hz/ 1 minute in X,
Y and Z
Directions: 2 hours each, 6 hours total.
Soak the sample in 260 ° C ± 5 ° C solder for 10 ± 0.5
seconds and place in room ambient, and measure
after 24 ± 2 hours.
(Pre-heating conditions)
Order Temperature Time
No problem observed
Within Tolerance
C ≥ 30pF : Q ≥ 1000
C<30pF : Q ≥ 400 + 20C
No problem observed
Within ± 2.5% or ± 0.25pF, whichever is larger
C ≥ 30pF : Q ≥ 1000
C<30pF : Q ≥ 400 + 20C
IR
1
2
80 to 100 ° C
150 to 200 ° C
2 minutes
2 minutes
Over 10000M Ω or 500M Ω ? μ F whichever is less
Withstanding The charge and discharge current of the capacitor
Voltage must not exceed 50mA for IR and withstanding
voltage measurement.
Soaking condition
Resist without problem
Solderablity
Sn-3Ag-0.5Cu
Sn63 Solder
245 ± 5 ° C
235 ± 5 ° C
3 ± 0.5 sec.
2 ± 0.5 sec.
Solder coverage : 90% min.
Temperature
Cycle
Appearance
Δ C
Q
IR
(Cycle)
Room temperature (3min.) →
Lowest operation temperature (30min.) →
Room temperature (3min.) →
Highest operation temperature(30min.)
No problem observed
Within ± 2.5% or ± 0.25pF, whichever is larger
C ≥ 30pF : Q ≥ 1000
C<30pF : Q ≥ 400 + 20C
Over 10000M Ω or 500M Ω ? μ F, whichever is less
After 5 cycles, measure after 24 ± 2 hours.
Withstanding
Voltage
The charge and discharge current of the capacitor
must not exceed 50mA for IR and withstanding
voltage measurement.
Resist without problem
Load
Humidity
Test
(Except CF
Series)
High-
Temperature
with Loading
Appearance
Δ C
Q
IR
Appearance
Δ C
Q
IR
After applying rated voltage for 500 + 12/ ? 0 hours
in pre-condition at 40 ° C ± 2 ° C, humidity 90 to
95%RH, allow parts to stabilize for 24 ± 2 hours, at
room temperature before measurement.
The charge and discharge current of the capacitor
must not exceed 50mA for IR measurement.
After applying twice the rated voltage at the
temperature of 125 ± 3 ° C for 1000 + 12/ ? 0 hours,
measure the sample after 24 ± 2 hours.
Apply 1.5 times when the rated voltage is 250V or over.
Apply 1.2 times when the rated voltage is 630V or over.
The charge and discharge current of the capacitor
must not exceed 50mA for IR measurement.
No problem observed
Within ± 7.5% or ± 0.75pF, whichever is larger
C ≥ 30pF : Q ≥ 200
C<30pF : Q ≥ 100 + 10C/ 3
Over 500M Ω or 25M Ω ? μ F, whichever is less
No problem observed.
Within ± 3% or ± 0.3pF, whichever is larger
C ≥ 30pF : Q ≥ 350
10pF<C<30pF : Q ≥ 275 + 5C/ 2
C<10pF : Q ≥ 200 + 10C
Over 1000M Ω or 50M Ω ? μ F, whichever is less
Please ask for individual specification for the hatched range in previous chart.
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